MTO-like reference mask modeling for advanced inverse lithography technology patterns

Autor: Takehisa, Kiwamu, Park, Jongju, Moon, Jongin, Son, Suein, Chung, Donghoon, Kim, Byung-Gook, Jeon, Chan-Uk, LoPresti, Patrick, Xue, Shan, Wang, Sonny, Broadbent, Bill, Kim, Soonho, Hur, Jiuk, Choo, Min
Zdroj: Proceedings of SPIE; July 2017, Vol. 10454 Issue: 1 p104540J-104540J-5, 940866p
Databáze: Supplemental Index