Impact of sub-pixelation within CdZnTe detectors for x-ray diffraction imaging systems
Autor: | Ashok, Amit, Franco, Edward D., Gehm, Michael E., Neifeld, Mark A., Tabary, J., Paulus, C., Montémont, G., Verger, L. |
---|---|
Zdroj: | Proceedings of SPIE; May 2017, Vol. 10187 Issue: 1 p101870J-101870J-10, 10085141p |
Databáze: | Supplemental Index |
Externí odkaz: |