Modeling and analysis of scattering from silicon nanoparticles with high excess carriers for MIR spectroscopy

Autor: Witzigmann, Bernd, Osiński, Marek, Arakawa, Yasuhiko, Shoer, Ibrahim, Nageeb, Ahmed, Osman, Abdelrahman, Mekawey, Hosam I., Ismail, Yehea, Swillam, Mohamed A.
Zdroj: Proceedings of SPIE; February 2017, Vol. 10098 Issue: 1 p100981K-100981K-7, 908837p
Databáze: Supplemental Index