| Autor: |
Brueckner-Foit, Angelika, Pitz, Pascal, Grahlmann, Phillip, Zeismann, Frank |
| Zdroj: |
Diffusion and Defect Data Part B: Solid State Phenomena; December 2016, Vol. 258 Issue: 1 p495-500, 6p |
| Abstrakt: |
The crack tip field of small fatigue cracks was measured using digital image correlation DIC. For this purpose, smooth specimen were fatigued until a certain amount of damage was visible on the surface. This specimens were then placed in a micro-tensile device in the SEM. The grey value patterns obtained at two different load levels were analyzed with DIC. Fitting the Williams series for the crack tip field to the corresponding DIC-displacement field in the crack tip area yielded the mode-I, and the mode-II stress intensity factors together with the T-stresses. It was found that the experimental values of the stress intensity factor were comparatively high with pronounced mode-II contributions. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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