| Autor: |
James, M. Neil, Christopher, Colin J., Díaz Garrido, Francisco Alberto, Vasco-Olmo, Jose M., Kakiuchi, Toshifumi, Patterson, Eann A. |
| Zdroj: |
Diffusion and Defect Data Part B: Solid State Phenomena; December 2016, Vol. 258 Issue: 1 p117-124, 8p |
| Abstrakt: |
This paper will outline the development of a model of crack tip fields that represents an innovation in incorporate the influences on crack tip displacement and stress fields of the zone of local plasticity that envelops a growing fatigue crack. The model uses assumed distributions of elastic stresses induced at the elastic-plastic boundary via wake contact and compatibility requirements, and defines a set of modified elastic stress intensity factors to characterise the crack stress or displacement tip field. In particular, recent work will be presented that compares the interpretation of plasticity-induced shielding obtained from trends observed in KR and KF with values of so-called ‘crack closure’ obtained via traditional strain gauge determination. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
|
