| Autor: |
Stollfuß, Carsten, Lietzau, Kai Henning, Richetta, Maria, Foitzik, Andreas H. |
| Zdroj: |
Materials Science Forum; November 2016, Vol. 879 Issue: 1 p1859-1864, 6p |
| Abstrakt: |
An essential part of cell cultivation via cell culture technology is the determination and monitoring of culture parameters. Such parameters refer to the vitality or mutual mutations of the cell culture, while the actual number of living cells in each batch indicates the correct growth rate rather than stagnation or an overgrowth of the cell culture. Today such parameters are determined by applying light microscopy methods or by staining specific constituents of the cells. Commonly such methods are a stressful procedure for the studied cells. Most applied dyes are toxic over a certain period of time and thus they are used in low concentrations only when necessary. Within this work a new kind of measurement device prototype was designed to address these problems. This device is based on the Electronic Speckle Pattern Interferometry (ESPI). ESPI is an optical high-resolution method combined with a photonic analysis system capable of analyzing cellular deformations and oscillations. In this approach the combination of a greatly modified microscope together with ESPI method is presented. The apparatus allows the determination of cellular deformation (i) at very high magnifications, (ii) with high lateral resolution. Furthermore the system studies (iii) contact free, (iv) in vitro cells, in a non-invasive and non-destructive way. A co-developed cultivation system allows monitoring the culture parameters in real time minimizing the stress for the cell culture. Since no additional substances are needed, the presented prototype is automated to a large extent and can be operated by a special control-and regulation system (CRS) based on a microcontroller development board (Arduino Mega). |
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