Soft X-ray microscope with nanometer spatial resolution and its applications

Autor: Romaniuk, Ryszard S., Kopczynski, Krzysztof, Jabczyński, Jan K., Mierczyk, Zygmunt, Wachulak, P. W., Torrisi, A., Bartnik, A., Wegrzynski, L., Fok, T., Patron, Z., Fiedorowicz, H.
Zdroj: Proceedings of SPIE; December 2016, Vol. 10159 Issue: 1 p101590W-101590W-8, 914319p
Databáze: Supplemental Index