Soft X-ray microscope with nanometer spatial resolution and its applications
Autor: | Romaniuk, Ryszard S., Kopczynski, Krzysztof, Jabczyński, Jan K., Mierczyk, Zygmunt, Wachulak, P. W., Torrisi, A., Bartnik, A., Wegrzynski, L., Fok, T., Patron, Z., Fiedorowicz, H. |
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Zdroj: | Proceedings of SPIE; December 2016, Vol. 10159 Issue: 1 p101590W-101590W-8, 914319p |
Databáze: | Supplemental Index |
Externí odkaz: |