| Autor: |
Pratapa, S., O?Connor, B. H., Low, I-M. |
| Zdroj: |
Powder Diffraction; September 1998, Vol. 13 Issue: 3 p166-170, 5p |
| Abstrakt: |
Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application?determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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