Demonstration of an N7 integrated fab process for metal oxide EUV photoresist

Autor: Panning, Eric M., Goldberg, Kenneth A., De Simone, Danilo, Mao, Ming, Kocsis, Michael, De Schepper, Peter, Lazzarino, Frederic, Vandenberghe, Geert, Stowers, Jason, Meyers, Stephen, Clark, Benjamin L., Grenville, Andrew, Luong, Vinh, Yamashita, Fumiko, Parnell, Doni
Zdroj: Proceedings of SPIE; March 2016, Vol. 9776 Issue: 1 p97760B-97760B-9, 879850p
Databáze: Supplemental Index