Sub-15nm patterning technology using directed self-assembly on nano-imprinting guide

Autor: Bencher, Christopher, Cheng, Joy Y., Morita, Seiji, Kanno, Masahiro, Yamamoto, Ryousuke, Sasao, Norikatsu, Sugimura, Shinobu
Zdroj: Proceedings of SPIE; March 2016, Vol. 9777 Issue: 1 p97770K-97770K-8, 879939p
Databáze: Supplemental Index