Improving scanner wafer alignment performance by target optimization

Autor: Sanchez, Martha I., Ukraintsev, Vladimir A., Leray, Philippe, Jehoul, Christiane, Socha, Robert, Menchtchikov, Boris, Raghunathan, Sudhar, Kent, Eric, Schoonewelle, Hielke, Tinnemans, Patrick, Tuffy, Paul, Belen, Jun, Wise, Rich
Zdroj: Proceedings of SPIE; March 2016, Vol. 9778 Issue: 1 p97782M-97782M-7, 880046p
Databáze: Supplemental Index