Electric fields in Scanning Electron Microscopy simulations

Autor: Sanchez, Martha I., Ukraintsev, Vladimir A., Arat, K. T., Bolten, J., Klimpel, T., Unal, N.
Zdroj: Proceedings of SPIE; March 2016, Vol. 9778 Issue: 1 p97780C-97780C-11, 9680232p
Databáze: Supplemental Index