Electric fields in Scanning Electron Microscopy simulations
Autor: | Sanchez, Martha I., Ukraintsev, Vladimir A., Arat, K. T., Bolten, J., Klimpel, T., Unal, N. |
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Zdroj: | Proceedings of SPIE; March 2016, Vol. 9778 Issue: 1 p97780C-97780C-11, 9680232p |
Databáze: | Supplemental Index |
Externí odkaz: |