| Autor: |
Prior, David J., Boyle, Alan P., Brenker, Frank, Cheadle, Michael C., Day, Austin, Lopez, Gloria, Peruzzo, Luca, Potts, Graham J., Reddy, Steve, Spiess, Richard, Timms, Nick E., Trimby, Pat, Wheeler, John, Zetterström, Lena |
| Zdroj: |
American Mineralogist (De Gruyter); November 1999, Vol. 84 p1741-1759, 19p |
| Abstrakt: |
In a scanning electron microscope (SEM) an electron beam sets up an omni-directional source of scattered electrons within a specimen. Diffraction of these electrons will occur simultaneously on all lattice planes in the sample and the backscattered electrons (BSE), which escape from the specimen, will form a diffraction pattern that can be imaged on a phosphor screen. This is the basis of electron backscatter diffraction (EBSD). Similar diffraction effects cause individual grains of different orientations to give different total BSE. SEM images that exploit this effect will show orientation contrast (OC). EBSD and OC imaging are SEM-based crystallographic tools. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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