Structural and Magnetic Properties of Ni50Mn35In15 Thin Films

Autor: Granovsky, Sergey, Gaidukova, Irina, Sokolov, Andrey, Devishvili, Anton, Snegirev, Vyacheslav
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; July 2015, Vol. 233 Issue: 1 p666-669, 4p
Abstrakt: We present the results of macroscopic measurements, X-ray diffraction and neutron reflectivity experiments on ≈ 25 nm thin films of Ni50Mn35In15 grown using Pulsed laser deposition technique on MgO single-crystalline substrate. Intrinsic magnetization of the film below Tc ≈ 290 K was confirmed. Structural measurements show the large temperature-dependent residual strain on the substrate with no indication of martensitic transition.
Databáze: Supplemental Index