| Autor: |
Shalygina, Elena E., Gan’shina, Elena A., Kharlamova, Anna M., Mukhin, Aleksander N., Kurlyandskaya, Galina V., Svalov, Andrey V. |
| Zdroj: |
Diffusion and Defect Data Part B: Solid State Phenomena; July 2015, Vol. 233 Issue: 1 p653-656, 4p |
| Abstrakt: |
The magnetic and magneto-optical properties of the Co/Si/Co thin-film samples obtained by magnetron sputtering were investigated employing magnetooptical techniques. The thickness of the Co layers was equal to 5 nm, and Si layer thickness varied in the interval of 0.2 to 3.2 nm. The magnetic saturation field of the samples under study was found to oscillate in the magnitude with the change of the Si layer thickness. This result was explained by structural features of the Co/Si/Co multilayers and the presence of the antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer. The peculiarities of the magneto-optical spectra of the Co/Si/Co samples were measured and discussed. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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