| Autor: |
Shipkova, Irina, Chekrygina, Juliya, Devizenko, Aleksandr, Lebedeva, Evgeniya, Syr'ev, Nikolay, Vyzulin, Sergey |
| Zdroj: |
Diffusion and Defect Data Part B: Solid State Phenomena; July 2015, Vol. 233 Issue: 1 p633-636, 4p |
| Abstrakt: |
Static magnetic properties, ferromagnetic resonance (FMR) and glancing angle X-ray diffraction spectra (GAXRD) of (CoFeB)/(nonmagnetic interlayer) nanosystems have been studied for three kinds of interlayers: dielectric (SiO2) and semiconductors (Si and SiC). Matter of discussion is the role of the interlayer material in forming of inner structure of magnetic layers and magnetization curve shape. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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