Region-of-interest cone beam computed tomography (ROI CBCT) with a high resolution CMOS detector
| Autor: | Hoeschen, Christoph, Kontos, Despina, Flohr, Thomas G., Jain, A., Takemoto, H., Silver, M. D., Nagesh, S. V. S., Ionita, C. N., Bednarek, D. R., Rudin, S. |
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| Zdroj: | Proceedings of SPIE; March 2015, Vol. 9412 Issue: 1 p94124L-94124L-7, 847124p |
| Databáze: | Supplemental Index |
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