Negative-tone imaging with EUV exposure for 14nm hp and beyond

Autor: Wood, Obert R., Panning, Eric M., Tsubaki, Hideaki, Nihashi, Wataru, Tsuchihashi, Toru, Fujimori, Toru, Momota, Makoto, Goto, Takahiro
Zdroj: Proceedings of SPIE; March 2015, Vol. 9422 Issue: 1 p94220N-94220N-12, 9327793p
Databáze: Supplemental Index