Autor: |
Hisamatsu, Tadashi, Kawasaki, Osamu, Matsuda, Sumio, Tsukamoto, Kazuyoshi |
Zdroj: |
Radiation Physics and Chemistry; January 1999, Vol. 53 Issue: 1 p25-30, 6p |
Abstrakt: |
In order to investigate the anomalous degradation of space silicon solar cells which was found in large fluence region, photoluminescence measurements are carried out for the cells irradiated with 1 MeV electrons with a fluence exceeding 1×1016e/cm2and 10 MeV protons with a fluence exceeding 1×1013p/cm2. For both irradiation, the intensity of boron-related bound exiton line decreases with fluence and it disappears at the fluences where the anomalous degradation occurs. The dominant defect is a complex of an interstitial carbon and an interstitial oxygen (CI–OI). The generation of five-vacancy-defects was also observed for the proton irradiation. Variations of photoluminescence line intensity are discussed in terms of displacement damage dose calculated based on non-ionizing energy loss (NIEL). |
Databáze: |
Supplemental Index |
Externí odkaz: |
|