| Autor: |
Rapp, George, Henrickson, Eiler, Miller, Michael, Aschenbrenner, Stanley |
| Zdroj: |
JOM Journal of the Minerals, Metals and Materials Society; January 1980, Vol. 32 Issue: 1 p35-45, 11p |
| Abstrakt: |
Trace-element analyses of native copper from specific geological deposits can be used to determine locality “fingerprints” (population parameters) which, in turn, can be used with discriminant analysis to assign probable provenance to the raw material source for copper artifacts. A comprehensive analytical program has been underway for over a decade to provide trace-element fingerprint data for native copper deposits throughout the world. Results indicate that delineations can be made among geographic regions and between areas or mines within a region. This paper is based on 309 analyses of the concentrations in North American native copper and copper artifacts. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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