Low-temperature strain relaxation in ion-irradiated pseudomorphic SiGe/Si structures

Autor: Avrutin, V. S., Izyumskaya, N. F., Vyatkin, A. F., Zinenko, V. I., Agafonov, Y. A., Irzhak, D. V., Roshchupkin, D. V., Steinman, E. A., Vdovin, V. I., Yugova, T. G.
Zdroj: Materials Science and Engineering B: Solid-State Materials for Advanced Technology; 2002, Vol. 89 Issue: 1-3 p350-354, 5p
Databáze: Supplemental Index