Optical and electrical spectroscopy of defects in low temperature grown GaAs
| Autor: | Steen, C., Kiesel, P., Tautz, S., Kramer, S., Soubatch, S., Malzer, S., Dohler, G. H. |
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| Zdroj: | Materials Science and Engineering B: Solid-State Materials for Advanced Technology; 2002, Vol. 88 Issue: 2-3 p191-194, 4p |
| Databáze: | Supplemental Index |
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