Autor:	Pershenkov, V.S., Bakerenkov, A.S., Yastrebov, A.T., Solomatin, A.V., Belyakov, V.V., Shurenkov, V.V.
Zdroj:	Advanced Materials Research; August 2014, Vol. 1016 Issue: 1 p478-483, 6p
Abstrakt:	The physical model, procedure of fitting parameter extraction and experimental study of the contribution of radiation induced charge neutralization (RICN) effect on enhanced low dose rate sensitivity (ELDRS) of bipolar devices are presented.
Databáze:	Supplemental Index
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