In-die registration measurement using novel model-based approach for advanced technology masks

Autor: Kato, Kokoro, Sato, Shunsuke, Laske, Frank, Kunitani, Shinji, Kamibayashi, Tatsuhiko, Fuse, Akira, Takahashi, Naoki, Roeth, Klaus-Dieter, Czerkas, Slawomir, Daneshpanah, Mehdi, Nagaoka, Yoshinori
Zdroj: Proceedings of SPIE; July 2014, Vol. 9256 Issue: 1 p92560E-92560E-8, 833049p
Databáze: Supplemental Index