Immersion lithography extension to sub-10nm nodes with multiple patterning

Autor: Lai, Kafai, Erdmann, Andreas, Owa, Soichi, Wakamoto, Shinji, Murayama, Masayuki, Yaegashi, Hidetami, Oyama, Kenichi
Zdroj: Proceedings of SPIE; April 2014, Vol. 9052 Issue: 1 p90520O-90520O-9, 814690p
Databáze: Supplemental Index