Reliability study on high-power 638nm broad stripe LD with a window-mirror structure
| Autor: | Zediker, Mark S., Yagi, Tetsuya, Mitsuyama, Hiroshi, Nishida, Takehiro, Kadoiwa, Kaoru, Kuramoto, Kyosuke |
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| Zdroj: | Proceedings of SPIE; March 2014, Vol. 8965 Issue: 1 p896502-896502-12 |
| Databáze: | Supplemental Index |
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