Full characterization of a focused wave field with sub 100 nm resolution
| Autor: | Tschentscher, Thomas, Tiedtke, Kai, Hoppe, Robert, Meier, Vivienne, Patommel, Jens, Seiboth, Frank, Lee, Hae Ja, Nagler, Bob, Galtier, Eric C., Arnold, Brice, Zastrau, Ulf, Hastings, Jerome, Nilsson, Daniel, Uhlén, Fredrik, Voigt, Ulrich, Hertz, Hans M., Schroer, Christian G., Schropp, Andreas |
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| Zdroj: | Proceedings of SPIE; May 2013, Vol. 8778 Issue: 1 p87780G-87780G-9, 790030p |
| Databáze: | Supplemental Index |
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