Role of 3D photo-resist simulation for advanced technology nodes

Autor: Conley, Will, Narayana Samy, Aravind, Seltmann, Rolf, Kahlenberg, Frank, Schramm, Jessy, Küchler, Bernd, Klostermann, Ulrich
Zdroj: Proceedings of SPIE; April 2013, Vol. 8683 Issue: 1 p86831E-86831E-9, 781489p
Databáze: Supplemental Index