Hybrid approach to optical CD metrology of directed self-assembly lithography

Autor: Starikov, Alexander, Cain, Jason P., Godny, Stephane, Asano, Masafumi, Kawamoto, Akiko, Wakamoto, Koichi, Matsuki, Kazuto, Bozdog, Cornel, Sendelbach, Matthew, Turovets, Igor, Urenski, Ronen, Milo, Renan
Zdroj: Proceedings of SPIE; April 2013, Vol. 8681 Issue: 1 p86812D-86812D-8, 781317p
Databáze: Supplemental Index