Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy
| Autor: | Schoenenberger, C., Houten, H. Van, Kerkhof, J. M., Donkersloot, H. C. |
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| Zdroj: | Applied Surface Science; 1993, Vol. 67 Issue: 1-4 p222-222, 1p |
| Databáze: | Supplemental Index |
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