Depth profiling sulphur in bulk CdTe and CdTe/CdS thin film heterojunctions
| Autor: | Lane, D. W., Conibeer, G. J., Romani, S., Healy, M. J. F., Rogers, K. D. |
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| Zdroj: | Nuclear Instruments and Methods in Physics Research Section B; 1998, Vol. 136 Issue: 1 p225-230, 6p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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