Comparative Study of n-LIGBT and n-LDMOS Structures on 4H-SiC

Autor: Häublein, Volker, Temmel, Gerhard, Mitlehner, Heinz, Rattmann, Gudrun, Strenger, Christian, Hürner, Andreas, Bauer, Anton, Ryssel, Heiner, Frey, Lothar
Zdroj: Materials Science Forum; January 2013, Vol. 740 Issue: 1 p887-890, 4p
Abstrakt: N-LDMOS and n-LIGBT structures were manufactured with the same dimensions on a 4H-SiC wafer in order to allow for a direct comparison. The comparison of the devices includes output and transfer characteristics, blocking characteristics, and temperature behavior.
Databáze: Supplemental Index