| Autor: |
Weber, Jonas, Beljakowa, Svetlana, Weber, Heiko B., Pensl, Gerhard, Zippelius, Bernd, Kimoto, Tsunenobu, Krieger, Michael |
| Zdroj: |
Materials Science Forum; January 2013, Vol. 740 Issue: 1 p377-380, 4p |
| Abstrakt: |
Deep Level Transient Spectroscopy (DLTS) investigations at different temperatures and with various filling pulse lengths were performed on n-type 4H-SiC epitaxial layers using Iridium Schottky contacts to determine the electrical capture process of the EH6-center. The temperature dependence of the electrical capture cross section σ ~ T-2.0 suggests a cascade capture process, which is not thermally activated. Together with earlier work by Zippelius et al. [4] this proves the acceptor-type of the EH6-center. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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