Global Space Charge Effect in SCALPEL

Autor: Mkrtchyan, M., Munro, E., Liddle, J. A., Stanton, S. T., Waskiewicz, W. K., Farrow, R. C., Katsap, V.
Zdroj: Microelectronic Engineering; 2000, Vol. 53 Issue: 1 p299-302, 4p
Databáze: Supplemental Index
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