Structural, electrical and optical characterization of semiconducting Ru2Si3

Autor: Lenssen, D., Carius, R., Mesters, S., Guggi, D., Bay, H.L., Mantl, S.
Zdroj: Microelectronic Engineering; 2000, Vol. 50 Issue: 1 p243-248, 6p
Databáze: Supplemental Index
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