| Autor: |
Cooper, Emanuel I., Rajaram, Rekha, Payne, Makonnen, Lippy, Steven |
| Zdroj: |
Diffusion and Defect Data Part B: Solid State Phenomena; December 2012, Vol. 195 Issue: 1 p143-145, 3p |
| Abstrakt: |
Titanium nitride (TiN) is widely used as a hard mask film protecting the inter-level dielectric (ILD) before metal or plating seed layer deposition steps. It is common practice to use a wet etch in order to remove residues formed during the ILD dry-etch step, and at the same time to remove some or all of the exposed TiN. From its thermochemical properties, it might be predicted that wet etching of TiN should be easy, since it is quite unstable with respect to both plain and oxidative hydrolysis. For example, in acidic solutions at 25oC [1, : |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
|
