| Autor: |
Byrappa, Shayan, Wu, Fang Zhen, Wang, Huan Huan, Raghothamachar, Balaji, Choi, Gloria, Sun, Shun, Dudley, Michael, Sanchez, Edward K., Hansen, Darren M., Drachev, Roman, Mueller, Stephan G., Loboda, Mark J. |
| Zdroj: |
Materials Science Forum; May 2012, Vol. 717 Issue: 1 p347-350, 4p |
| Abstrakt: |
A review is presented of Synchrotron White Beam X-ray Topography (SWBXT) studies of stacking faults observed in PVT-Grown 4H-SiC crystals. A detailed analysis of various interesting phenomena were performed and one such observation is the deflection of threading dislocations with Burgers vector c/c+a onto the basal plane and associated stacking faults. Based on the model involving macrostep overgrowth of surface outcrops of threading dislocations, SWBXT image contrast studies of these stacking faults on different reflections and comparison with calculated phase shits for postulated fault vectors, has revealed faults to be of basically four types: (a) Frank faults; (b) Shockley faults; (c) Combined Shockley + Frank faults with fault vector s+c/2; (d) Combined Shockley + Frank faults with fault vector s+c/4. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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