RHEED investigation of limiting thickness epitaxy during low-temperature Si-MBE on (100) surface
| Autor: | Nikiforov, A. I., Kanter, B. Z., Pchelyakov, O. P. |
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| Zdroj: | Thin Solid Films; 1998, Vol. 336 Issue: 1 p179-182, 4p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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