HRTEM study of strained Si/Ge multilayers
| Autor: | Romeo, M., Uhlaq-Bouillet, C., Deville, J. P., Werckmann, J., Ehret, G., Chelly, R., Dentel, D., Angot, T., Bischoff, J. L. |
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| Zdroj: | Thin Solid Films; 1998, Vol. 319 Issue: 1 p171-174, 4p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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