Atomic force microscopy study of the topographic evolution of polyacrylonitrile thin films submitted to a rapid thermal treatment

Autor: Newton, P., Houze, F., Guessab, S., Noel, S., Boyer, L., Lecayon, G., Viel, P.
Zdroj: Thin Solid Films; 1997, Vol. 303 Issue: 1 p200-206, 7p
Databáze: Supplemental Index