HRTEM study of Si~1~-~xGe~x multilayer

Autor: Werckmann, J., Chelly, R., Ulhaq-Bouillet, C., Romeo, M., Teodorescu, C., Ghica, C.
Zdroj: Thin Solid Films; 1997, Vol. 294 Issue: 1 p80-83, 4p
Databáze: Supplemental Index