Structural determination of the C~6~0/Ge(111) interface via X-ray diffraction
Autor: | Kidd, T., Aburano, R. D., Hong, H., Gog, T., Chiang, T.-C. |
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Zdroj: | Surface Science; 1998, Vol. 397 Issue: 1 p185-190, 6p |
Databáze: | Supplemental Index |
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