Structural determination of the C~6~0/Ge(111) interface via X-ray diffraction

Autor: Kidd, T., Aburano, R. D., Hong, H., Gog, T., Chiang, T.-C.
Zdroj: Surface Science; 1998, Vol. 397 Issue: 1 p185-190, 6p
Databáze: Supplemental Index