| Autor: |
Günster, J., Mayer, Th., Brause, M., Maus-Friedrichs, W., Busmann, H.G., Kempter, V. |
| Zdroj: |
Surface Science; 1995, Vol. 336 Issue: 3 p341-352, 12p |
| Abstrakt: |
Metastable impact electron spectroscopy (MIES) in combination with UPS (He I) is applied to study the electronic properties of surface adsorbed C60molecules. The growth of C60layers on clean, thermally oxidized and cesiated Si(100) is monitored by recording the spectra of the electrons ejected during the layer growth at room temperature. The various mechanisms for electron ejection during the interaction of photons and He* metastables with C60are discussed. The results furnish also information on the interaction between the studied Si(100)-based substrates and the C60adsorbates. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
|
Full Text from ScienceDirect