Characterization of oxide traps in 0.15 mm2 MOSFETs using random telegraph signals
| Autor: | Amarasinghe, N. V., Celik-Butler, Z., Vasina, P. |
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| Zdroj: | Microelectronics Reliability; 2000, Vol. 40 Issue: 11 p1875-1881, 7p |
| Databáze: | Supplemental Index |
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