MOSFET parameter degradation after Fowler Nordheim injection stress
| Autor: | Candelori, A., Gomiero, E., Ghidini, G., Paccagnella, A. |
|---|---|
| Zdroj: | Microelectronics Reliability; 1998, Vol. 38 Issue: 2 p189-194, 6p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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| Autor: | Candelori, A., Gomiero, E., Ghidini, G., Paccagnella, A. |
|---|---|
| Zdroj: | Microelectronics Reliability; 1998, Vol. 38 Issue: 2 p189-194, 6p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
|
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