Two-sided bounds of reliability for large systems
| Autor: | Gurov, S. V., Utkin, L. V., Shubinsky, I. B. |
|---|---|
| Zdroj: | Microelectronics Reliability; 1995, Vol. 35 Issue: 5 p841-841, 1p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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| Autor: | Gurov, S. V., Utkin, L. V., Shubinsky, I. B. |
|---|---|
| Zdroj: | Microelectronics Reliability; 1995, Vol. 35 Issue: 5 p841-841, 1p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
|
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