Structural studies on amorphous Si~2O~3 and H~2Si~2O~4 by means of diffraction using high energy photons
Autor: | Hagenmayer, R. M., Friede, B., Jansen, M. |
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Zdroj: | Journal of Non-Crystalline Solids; 1998, Vol. 226 Issue: 3 p225-231, 7p |
Databáze: | Supplemental Index |
Externí odkaz: |