Characterization of electrical and optical loss of MOCVD regrowth in strained layer InGaAs-GaAs quantum well heterostructure lasers

Autor: Cockerill, T. M., Honig, J., Forbes, D. V., Beernink, K. J.
Zdroj: Journal of Crystal Growth; 1992, Vol. 124 Issue: 1 p553-553, 1p
Databáze: Supplemental Index