Compton imaging with a planar semiconductor system using pulse shape analysis

Autor: Sweeney, Anthony, Boston, Andrew J., Boston, Helen C., Cresswell, John P., Dormand, Jamie, Ellis, Mark, Harkness, Laura J., Jones, Martin, Judson, Daniel S., Nolan, Paul J., Oxley, David C., Scraggs, David P., Slee, Mike J., Thandi, Amandeep
Zdroj: Proceedings of SPIE; May 2011, Vol. 8018 Issue: 1 p80180J-80180J-11, 7937832p
Abstrakt: Homeland security agencies have a requirement to locate and identify nuclear material. Compton cameras [1, 2] offer a more efficient method of gamma-ray detection than collimated detector systems. The resolution of the interaction positions within the detectors greatly influences the accuracy of a reconstructed Compton image. Utilizing digital electronics and applying pulse shape analysis [3] allows the spatial resolution to be enhanced beyond the pixel granularity in three dimensions. Analytically reconstructed Compton images from a range of radiation sources shall be presented with and without pulse shape analysis showing the improvements gained along with a discussion of our analysis methods.
Databáze: Supplemental Index