| Autor: |
Hu, Guo Jun, Hong, Zhi Quan |
| Zdroj: |
Advanced Materials Research; October 2010, Vol. 152 Issue: 1 p1313-1316, 4p |
| Abstrakt: |
In this paper, the compression test on the bulk nanocrystalline sliver ( n Ag) with average grain size of 50 nm was made. The stress-strain curves under different strain rates were obtained by test. The test results show that the mechanical behavior of n Ag is rate-dependent, and the dynamic compress yield stress are about 1.5 times of that n Ag in static test condition; The effect of strain harding on n Ag is smaller than that of coarse-grained silver (c Ag) in plastic deformation; The relationship between the yield strength and the logarithm of strain rate is approximately linear. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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